Boundary scan

#	Item
181	PDF Document Add to Reading List Source URL: focus.ti.com Language: English Electronics Joint Test Action Group Design for testing Serial Vector Format Texas Instruments Scan chain Built-in self-test Boundary scan Electronics manufacturing Manufacturing Electronic engineering
182	PDF Document Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-06-30 10:49:35 Boundary scan Boundary scan description language Serial Vector Format Electronics manufacturing Technology Joint Test Action Group
183	PDF Document Add to Reading List Source URL: pdfserv.maxim-ic.com Language: English Embedded systems IEEE standards Electronic engineering Joint Test Action Group Microcontrollers I²C Boundary scan EEPROM Atmel AVR Electronics manufacturing Electronics Manufacturing